Wurtzite structure ZnO films doped with 0.5 and 1.7 at% Cu were deposited by helicon magnetron sputtering. The prepared films exhibited room-temperature (RT) ferromagnetism (FM). Maximum RT saturation magnetization of 2 emu/cm3 (~ 0.3μB/Cu) was observed for ZnO film with 1.7 at% Cu. Cu ions were in a bivalent state as identified by X-ray photoelectron spectroscopy (XPS). In photoluminescence spectra, the green emission peak increased and redshifted due to the incorporation of Cu or defects induced by Cu incorporation. Since Cu and Cu-related oxides are not RT ferromagnetic, and no trace of ferromagnetic contamination was detected in XPS results, the observed FM is considered to be an intrinsic property of Cu-doped ZnO films. The FM was thought to originate from defect-related mechanisms.
|ジャーナル||Physica Status Solidi (B) Basic Research|
|出版ステータス||Published - 6月 2009|
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