Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

H. Michinishi; T. Yokohira; T. Okamoto

doi:10.1109/ATS.1993.398773

Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

H. Michinishi, T. Yokohira, T. Okamoto

研究成果

抄録

In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT.

本文言語	English
ホスト出版物のタイトル	ATS 1993 Proceedings - 2nd Asian Test Symposium
出版社	IEEE Computer Society
ページ	14-19
ページ数	6
ISBN（電子版）	081863930X
DOI	https://doi.org/10.1109/ATS.1993.398773
出版ステータス	Published - 1993
イベント	2nd IEEE Asian Test Symposium, ATS 1993 - Beijing 継続期間: 11月 16 1993 → 11月 18 1993

出版物シリーズ

名前	Proceedings of the Asian Test Symposium
ISSN（印刷版）	1081-7735

Conference

Conference	2nd IEEE Asian Test Symposium, ATS 1993
国/地域	China
City	Beijing
Period	11/16/93 → 11/18/93

ASJC Scopus subject areas

電子工学および電気工学

文献へのアクセス

10.1109/ATS.1993.398773

他のファイルとリンク

フィンガープリント

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引用スタイル

Michinishi, H, Yokohira, T & Okamoto, T 1993, Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs. in ATS 1993 Proceedings - 2nd Asian Test Symposium., 398773, Proceedings of the Asian Test Symposium, IEEE Computer Society, pp. 14-19, 2nd IEEE Asian Test Symposium, ATS 1993, Beijing, China, 11/16/93. https://doi.org/10.1109/ATS.1993.398773

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