NIST Statistical Test for Random Sequence Generated by Möbius Function

研究成果

抄録

Random sequences play important roles in many security applications. Several security protocols have been developed based on random sequences. Hence, their generation is one of the topic of interests among many cryptographic researchers. Previously, the authors proposed a pseudo random sequence over odd characteristic field which is generated by applying primitive polynomial, trace function and Mobius function. Some important properties such as period, autocorrelation and cross-correlation have been presented in previous work. Randomness is generally measured by statistical tests and NIST Statistical Test Suite (NIST STS) is one of the most popular tools for randomness analysis. In this work, the randomness of the generated sequence is investigated by NIST STS.

本文言語English
ホスト出版物のタイトル2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781728132792
DOI
出版ステータスPublished - 5月 2019
イベント6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019 - Yilan
継続期間: 5月 20 20195月 22 2019

出版物シリーズ

名前2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019

Conference

Conference6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
国/地域Taiwan, Province of China
CityYilan
Period5/20/195/22/19

ASJC Scopus subject areas

  • コンピュータ ネットワークおよび通信
  • コンピュータ サイエンスの応用
  • コンピュータ ビジョンおよびパターン認識
  • 電子工学および電気工学

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