TY - GEN
T1 - NIST Statistical Test for Random Sequence Generated by Möbius Function
AU - Akhter, Fatema
AU - Kodera, Yuta
AU - Nogami, Yasuyuki
AU - Kusaka, Takuya
N1 - Funding Information:
ACKNOWLEDGMENT This work was partly supported by JSPS KAKENHI Grantin-Aid for Scientific Research (A) 16H01723.
Publisher Copyright:
© 2019 IEEE.
PY - 2019/5
Y1 - 2019/5
N2 - Random sequences play important roles in many security applications. Several security protocols have been developed based on random sequences. Hence, their generation is one of the topic of interests among many cryptographic researchers. Previously, the authors proposed a pseudo random sequence over odd characteristic field which is generated by applying primitive polynomial, trace function and Mobius function. Some important properties such as period, autocorrelation and cross-correlation have been presented in previous work. Randomness is generally measured by statistical tests and NIST Statistical Test Suite (NIST STS) is one of the most popular tools for randomness analysis. In this work, the randomness of the generated sequence is investigated by NIST STS.
AB - Random sequences play important roles in many security applications. Several security protocols have been developed based on random sequences. Hence, their generation is one of the topic of interests among many cryptographic researchers. Previously, the authors proposed a pseudo random sequence over odd characteristic field which is generated by applying primitive polynomial, trace function and Mobius function. Some important properties such as period, autocorrelation and cross-correlation have been presented in previous work. Randomness is generally measured by statistical tests and NIST Statistical Test Suite (NIST STS) is one of the most popular tools for randomness analysis. In this work, the randomness of the generated sequence is investigated by NIST STS.
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U2 - 10.1109/ICCE-TW46550.2019.8992033
DO - 10.1109/ICCE-TW46550.2019.8992033
M3 - Conference contribution
AN - SCOPUS:85080136921
T3 - 2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
BT - 2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
Y2 - 20 May 2019 through 22 May 2019
ER -