Hard X-ray and soft X-ray photoemission study of vanadium oxides

R. Eguchi, Y. Takata, M. Matsunami, K. Horiba, K. Yamamoto, M. Taguchi, A. Chainani, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, I. H. Inoue, S. Shin

研究成果査読

抄録

We study the electronic structure of Mott-Hubbard systems SrVO3 and CaVO3 with photoemission spectroscopy (PES) using hard X-rays (HX) (h ν∼ 8 keV) and soft X-rays (SX) (h ν∼ 900 eV). In HX-PES results, the V 2p core levels of SrVO3 and CaVO3 show clear additional intensity, which are not observed in SX-PES. These features originate from bulk screening by coherent states at Fermi level as observed in other 3d transition metal oxides. From the comparison between SrVO3 and CaVO3 in HX-PES, the intensity in SrVO3 is nearly similar to CaVO3. The results suggest screening from coherent states is more efficient in HX-PES compared to SX-PES.

本文言語English
ページ(範囲)e289-e291
ジャーナルJournal of Magnetism and Magnetic Materials
310
2 SUPPL. PART 2
DOI
出版ステータスPublished - 3月 1 2007
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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