Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6–33 keV

T. Masuda, T. Hiraki, H. Kaino, S. Kishimoto, Y. Miyamoto, K. Okai, S. Okubo, R. Ozaki, N. Sasao, K. Suzuki, S. Uetake, A. Yoshimi, K. Yoshimura

研究成果査読

3 被引用数 (Scopus)

抄録

This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.

本文言語English
ページ(範囲)72-77
ページ数6
ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
913
DOI
出版ステータスPublished - 1月 1 2019

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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