TY - JOUR
T1 - Effect of low-energy ion bombardment upon field-stimulated exoelectron emission from tungsten surfaces
AU - Shiota, Tadashi
AU - Kibi, Sinji
AU - Yamamoto, Ryo
AU - Tagawa, Masahito
AU - Ohmae, Nobuo
AU - Umeno, Masataka
PY - 2000/1/1
Y1 - 2000/1/1
N2 - The field-stimulated exoelectron emission (FSEE) from a tungsten surface bombarded by helium ions with incident energies ranging from 300 to 580 eV was investigated. When a tip was cooled down to 185 K, FSEE was clearly detected at the ion-bombarded tungsten surface with incident energies higher than 500 eV which corresponds to the sputtering threshold of tungsten atoms. A decay of FSEE intensity was also observed after the ion bombardment. In contrast, FSEE was not obvious at the tip temperature of 300 K. These experimental results would be explained by the emission model which is related to a rearrangement of surface tungsten atoms distorted by the ion bombardment.
AB - The field-stimulated exoelectron emission (FSEE) from a tungsten surface bombarded by helium ions with incident energies ranging from 300 to 580 eV was investigated. When a tip was cooled down to 185 K, FSEE was clearly detected at the ion-bombarded tungsten surface with incident energies higher than 500 eV which corresponds to the sputtering threshold of tungsten atoms. A decay of FSEE intensity was also observed after the ion bombardment. In contrast, FSEE was not obvious at the tip temperature of 300 K. These experimental results would be explained by the emission model which is related to a rearrangement of surface tungsten atoms distorted by the ion bombardment.
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U2 - 10.1143/JJAP.39.L110
DO - 10.1143/JJAP.39.L110
M3 - Article
AN - SCOPUS:0033871856
SN - 0021-4922
VL - 39
SP - L110-L112
JO - Japanese Journal of Applied Physics, Part 2: Letters
JF - Japanese Journal of Applied Physics, Part 2: Letters
IS - 2 A
ER -