TY - JOUR
T1 - Design and implementation of convolutional neural network-based SVM technique for manufacturing defect detection
AU - Nagata, Fusaomi
AU - Habib, Maki K.
AU - Watanabe, Keigo
N1 - Publisher Copyright:
© 2021 Inderscience Enterprises Ltd.. All rights reserved.
PY - 2021
Y1 - 2021
N2 - This paper introduces the design, implementation, training and testing of deep convolutional neural network (DCNN)-based support vector machines (SVMs). These DCNN-based SVMs are designed using software tools developed by the authors that enable them to construct, train, and test the DCNN-based SVMs and effectively facilitate vision-based inspection to detect different undesirable manufacturing defects. Two pretrained DCNNs are used for this purpose: the sssNet is developed by the authors and was trained using many actual and simple target images consisting of seven categories, and the standard AlexNet that was trained by a large number of images consisting of 1,000 categories. In this work, the pretrained sssNet and AlexNet are used as feature vector extractors in training and testing. The generated feature vectors are used as inputs to train SVMs for the final binary classification represented as accept (OK) or reject (NG) category.
AB - This paper introduces the design, implementation, training and testing of deep convolutional neural network (DCNN)-based support vector machines (SVMs). These DCNN-based SVMs are designed using software tools developed by the authors that enable them to construct, train, and test the DCNN-based SVMs and effectively facilitate vision-based inspection to detect different undesirable manufacturing defects. Two pretrained DCNNs are used for this purpose: the sssNet is developed by the authors and was trained using many actual and simple target images consisting of seven categories, and the standard AlexNet that was trained by a large number of images consisting of 1,000 categories. In this work, the pretrained sssNet and AlexNet are used as feature vector extractors in training and testing. The generated feature vectors are used as inputs to train SVMs for the final binary classification represented as accept (OK) or reject (NG) category.
KW - CNN
KW - Convolutional neural network
KW - Defect inspection system
KW - Edge extraction
KW - One-class learning of SVM
KW - Support vector machine
KW - SVM
KW - Template matching
KW - Two-class learning of SVM
UR - http://www.scopus.com/inward/record.url?scp=85106725192&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85106725192&partnerID=8YFLogxK
U2 - 10.1504/IJMA.2021.115240
DO - 10.1504/IJMA.2021.115240
M3 - Article
AN - SCOPUS:85106725192
SN - 2045-1059
VL - 8
SP - 53
EP - 61
JO - International Journal of Mechatronics and Automation
JF - International Journal of Mechatronics and Automation
IS - 2
ER -