TY - GEN
T1 - A 603 Mrad total-ionizing-dose tolerance optically reconfigurable gate array VLSI
AU - Fujimori, Takumi
AU - Watanabe, Minoru
N1 - Funding Information:
ACKNOWLEDGMENTS This research was partly supported by the Initiatives for Atomic Energy Basic and Generic Strategic Research No. 283101, the Ministry of Education, Science, Sports and Culture, Grant-in-Aid for JSPS Research Fellow, No. 16J12063 and Grant-in-Aid for Scientific Research(B), No. 15H02676. The VLSI chip in this study was fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC), the University of Tokyo in collaboration with Rohm Co. Ltd. and Toppan Printing Co. Ltd.
Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/4
Y1 - 2018/6/4
N2 - Recently, radiation-hardened SRAM-based field programmable gate arrays (FPGAs), anti-fuse FPGAs, and radiation-hardened flash-based FPGAs have been used frequently for space systems. The total-ionizing-dose tolerances of such radiation-hardened FPGAs are limited to a 1 Mrad total ionizing dose. However, if the total-ionizing-dose tolerance of the embedded systems could be increased, a shield-less space embedded system could be realized, drastically decreasing rocket launch costs. This paper therefore presents a proposal of a new, radiation-hardened optically reconfigurable gate array very large scale integration (VLSI) exploiting its parallel configuration. The total-ionizing-dose tolerance of the radiation-hardened optically reconfigurable gate array has been measured experimentally as a 603 Mrad total-ionizing-dose using a Cobalt 60 gamma radiation source, which has at least 603 times higher radiation tolerance than those of currently available radiation-hardened FPGAs.
AB - Recently, radiation-hardened SRAM-based field programmable gate arrays (FPGAs), anti-fuse FPGAs, and radiation-hardened flash-based FPGAs have been used frequently for space systems. The total-ionizing-dose tolerances of such radiation-hardened FPGAs are limited to a 1 Mrad total ionizing dose. However, if the total-ionizing-dose tolerance of the embedded systems could be increased, a shield-less space embedded system could be realized, drastically decreasing rocket launch costs. This paper therefore presents a proposal of a new, radiation-hardened optically reconfigurable gate array very large scale integration (VLSI) exploiting its parallel configuration. The total-ionizing-dose tolerance of the radiation-hardened optically reconfigurable gate array has been measured experimentally as a 603 Mrad total-ionizing-dose using a Cobalt 60 gamma radiation source, which has at least 603 times higher radiation tolerance than those of currently available radiation-hardened FPGAs.
KW - Field programmable gate arrays
KW - optically reconfigurable gate arrays
KW - radiation hardened devices
KW - total ionizing dose tolerance
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U2 - 10.1109/ICSIGSYS.2018.8372766
DO - 10.1109/ICSIGSYS.2018.8372766
M3 - Conference contribution
AN - SCOPUS:85049333816
T3 - 2018 International Conference on Signals and Systems, ICSigSys 2018 - Proceedings
SP - 249
EP - 254
BT - 2018 International Conference on Signals and Systems, ICSigSys 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on Signals and Systems, ICSigSys 2018
Y2 - 1 May 2018 through 3 May 2018
ER -