XAFS study on a pressure-induced superconductor Cs3C60 under high pressure

Satoshi Fujiki, Yoshihiro Kubozono, Yasuhiro Takabayashi, Setsuo Kashino, Shuichi Emura

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2 Citations (Scopus)

Abstract

Cs K-edge XAFS of Cs3C60 which is a pressure-induced superconductor were measured at 21 and 34 kbar by using a diamond anvil cell (DAC) in order to obtain the structural information under high pressure, and to clarify the origin of the pressure-induced superconductivity. The distances and the mean square displacements between the Cs and C atoms are consistent with those determined by X-ray powder diffraction. Consequently, the high-pressure XAFS can give the reliable structural-information on a fullerene superconductor under high pressure. We also show the procedure of the analysis of high-pressure XAFS with DAC in detail.

Original languageEnglish
Pages (from-to)725-727
Number of pages3
JournalJournal of Synchrotron Radiation
Volume8
Issue number2
DOIs
Publication statusPublished - Mar 1 2001

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Keywords

  • Cs K-edge XAFS
  • DAC
  • High pressure
  • Pressure-induced superconductor

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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