XAFS in the high-energy region

Y. Nishihata, O. Kamishima, Yoshihiro Kubozono, H. Maeda, S. Emura

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Abstract

XAFS (X-ray absorption fine-structure) spectra were measured near K-absorption edges of Ce (40.5 keV), Dy (53.8 keV), Ta (67.4 keV) and Pt (78.4 keV). The blunt K-edge jump due to the finite lifetime of the core hole was observed. This makes it difficult to extract EXAFS (extended X-ray absorption fine-structure) functions at low k values. Local structure parameters can be evaluated from the EXAFS spectra above K-absorption edges in the high-energy region as well as from those above LIII-edges. It was found that the finite-lifetime effect of the core hole is effectively taken into the photoelectron mean-free-path term, as predicted theoretically.

Original languageEnglish
Pages (from-to)1007-1009
Number of pages3
JournalJournal of Synchrotron Radiation
Volume5
Issue number3
Publication statusPublished - May 1 1998

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Keywords

  • Extended X-ray fine-structure (EXAFS)
  • Structure parameters
  • X-ray absorption fine-structure (XAFS)

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Radiation

Cite this

Nishihata, Y., Kamishima, O., Kubozono, Y., Maeda, H., & Emura, S. (1998). XAFS in the high-energy region. Journal of Synchrotron Radiation, 5(3), 1007-1009.