X-ray Raman scattering for structural investigation of silica/silicate minerals

H. Fukui, Masami Kanzaki, N. Hiraoka, Y. Q. Cai

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We have performed X-ray Raman scattering (XRS) measurements on the oxygen K and silicon L absorption edges of four silica minerals: α-quartz, α-cristobalite, coesite, and stishovite. We have also calculated the partial electron densities of states (DOSs) and compared these with the XRS spectra. This study demonstrates that the short-range structure around the atom of interest strongly influences the XRS spectral features. Importantly, the oxygen K-edge XRS spectra are found to reflect the p-orbital DOS while the silicon L-edge spectra reflect the s- and d-orbital DOSs, even when a product of a momentum transfer and a mean radius of a electron orbit (1s for oxygen and 2p for silicon), Qr, is close to or larger than unity. Building on this, calculations of the partial DOSs for other silica phases are presented, including ultra-high-pressure phases, which provide a good reference for further XRS study of silica and silicate minerals. XRS measurements should be performed on not only either of oxygen or silicon but also on many kinds of constituent elements to reveal the structural change of glasses/melts of silicates under extreme conditions.

Original languageEnglish
Pages (from-to)171-181
Number of pages11
JournalPhysics and Chemistry of Minerals
Volume36
Issue number3
DOIs
Publication statusPublished - 2009

Fingerprint

silica mineral
Silicate minerals
silicate mineral
X ray scattering
Silicon Dioxide
Raman scattering
Silica
scattering
Silicon
silicon
Oxygen
oxygen
stishovite
Silicates
cristobalite
coesite
Electronic density of states
Quartz
momentum transfer
Momentum transfer

Keywords

  • Electronic structure
  • Intermediate structure
  • Short-range structure
  • SiOpolymorphs
  • X-ray Raman scattering

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Materials Science(all)

Cite this

X-ray Raman scattering for structural investigation of silica/silicate minerals. / Fukui, H.; Kanzaki, Masami; Hiraoka, N.; Cai, Y. Q.

In: Physics and Chemistry of Minerals, Vol. 36, No. 3, 2009, p. 171-181.

Research output: Contribution to journalArticle

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