X-ray Raman scattering for structural investigation of silica/silicate minerals

H. Fukui, M. Kanzaki, N. Hiraoka, Y. Q. Cai

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)

    Abstract

    We have performed X-ray Raman scattering (XRS) measurements on the oxygen K and silicon L absorption edges of four silica minerals: α-quartz, α-cristobalite, coesite, and stishovite. We have also calculated the partial electron densities of states (DOSs) and compared these with the XRS spectra. This study demonstrates that the short-range structure around the atom of interest strongly influences the XRS spectral features. Importantly, the oxygen K-edge XRS spectra are found to reflect the p-orbital DOS while the silicon L-edge spectra reflect the s- and d-orbital DOSs, even when a product of a momentum transfer and a mean radius of a electron orbit (1s for oxygen and 2p for silicon), Qr, is close to or larger than unity. Building on this, calculations of the partial DOSs for other silica phases are presented, including ultra-high-pressure phases, which provide a good reference for further XRS study of silica and silicate minerals. XRS measurements should be performed on not only either of oxygen or silicon but also on many kinds of constituent elements to reveal the structural change of glasses/melts of silicates under extreme conditions.

    Original languageEnglish
    Pages (from-to)171-181
    Number of pages11
    JournalPhysics and Chemistry of Minerals
    Volume36
    Issue number3
    DOIs
    Publication statusPublished - 2009

    Keywords

    • Electronic structure
    • Intermediate structure
    • Short-range structure
    • SiOpolymorphs
    • X-ray Raman scattering

    ASJC Scopus subject areas

    • Materials Science(all)
    • Geochemistry and Petrology

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