| Original language | English |
|---|---|
| Pages (from-to) | 507-514 |
| Number of pages | 8 |
| Journal | Advanced Reliability Modeling Proceeding of the 2004 Asian International Workshop |
| Publication status | Published - 2004 |
X-ray Image analysis of Defects at BGA for Manufacturing System Reliability
Toshinori Maruyama
Research output: Contribution to journal › Article