X-ray diffraction study of MgB2 at low temperatures

Y. Xue, S. Asada, A. Hosomichi, S. Naher, J. Xue, H. Kaneko, H. Suzuki, T. Muranaka, J. Akimitsu

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Abstract

We have performed powder X-ray diffraction of MgB2 superconductor between 10 and 300 K. Temperature dependence of integrated intensities of both (002) and (110) X-ray reflections shows a peak at around TC, superconducting transition temperature. The integrated intensity of the X-ray reflection is related to the phonon frequency through a Debye-Waller factor. Lattice parameters a and c show negative thermal expansions at low temperatures. The negative thermal expansion might be due to an electronic origin and not directly related to the superconducting transition.

Original languageEnglish
Pages (from-to)1105-1115
Number of pages11
JournalJournal of Low Temperature Physics
Volume138
Issue number5-6
DOIs
Publication statusPublished - Mar 1 2005
Externally publishedYes

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Keywords

  • Electron-photon interaction
  • Fermi liquid
  • MgB
  • Negative thermal expansion
  • Superconductivity
  • X-ray diffraction

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Xue, Y., Asada, S., Hosomichi, A., Naher, S., Xue, J., Kaneko, H., Suzuki, H., Muranaka, T., & Akimitsu, J. (2005). X-ray diffraction study of MgB2 at low temperatures. Journal of Low Temperature Physics, 138(5-6), 1105-1115. https://doi.org/10.1007/s10909-004-2903-2