X-ray diffraction study of MgB2 at low temperatures

Y. Xue, S. Asada, A. Hosomichi, S. Naher, J. Xue, H. Kaneko, H. Suzuki, T. Muranaka, Jun Akimitsu

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We have performed powder X-ray diffraction of MgB2 superconductor between 10 and 300 K. Temperature dependence of integrated intensities of both (002) and (110) X-ray reflections shows a peak at around TC, superconducting transition temperature. The integrated intensity of the X-ray reflection is related to the phonon frequency through a Debye-Waller factor. Lattice parameters a and c show negative thermal expansions at low temperatures. The negative thermal expansion might be due to an electronic origin and not directly related to the superconducting transition.

Original languageEnglish
Pages (from-to)1105-1115
Number of pages11
JournalJournal of Low Temperature Physics
Volume138
Issue number5-6
DOIs
Publication statusPublished - Mar 2005
Externally publishedYes

Fingerprint

X ray diffraction
X rays
thermal expansion
diffraction
X ray powder diffraction
Superconducting materials
Superconducting transition temperature
Lattice constants
x rays
Temperature
lattice parameters
transition temperature
temperature dependence
electronics
Negative thermal expansion

Keywords

  • Electron-photon interaction
  • Fermi liquid
  • MgB
  • Negative thermal expansion
  • Superconductivity
  • X-ray diffraction

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Xue, Y., Asada, S., Hosomichi, A., Naher, S., Xue, J., Kaneko, H., ... Akimitsu, J. (2005). X-ray diffraction study of MgB2 at low temperatures. Journal of Low Temperature Physics, 138(5-6), 1105-1115. https://doi.org/10.1007/s10909-004-2903-2

X-ray diffraction study of MgB2 at low temperatures. / Xue, Y.; Asada, S.; Hosomichi, A.; Naher, S.; Xue, J.; Kaneko, H.; Suzuki, H.; Muranaka, T.; Akimitsu, Jun.

In: Journal of Low Temperature Physics, Vol. 138, No. 5-6, 03.2005, p. 1105-1115.

Research output: Contribution to journalArticle

Xue, Y, Asada, S, Hosomichi, A, Naher, S, Xue, J, Kaneko, H, Suzuki, H, Muranaka, T & Akimitsu, J 2005, 'X-ray diffraction study of MgB2 at low temperatures', Journal of Low Temperature Physics, vol. 138, no. 5-6, pp. 1105-1115. https://doi.org/10.1007/s10909-004-2903-2
Xue Y, Asada S, Hosomichi A, Naher S, Xue J, Kaneko H et al. X-ray diffraction study of MgB2 at low temperatures. Journal of Low Temperature Physics. 2005 Mar;138(5-6):1105-1115. https://doi.org/10.1007/s10909-004-2903-2
Xue, Y. ; Asada, S. ; Hosomichi, A. ; Naher, S. ; Xue, J. ; Kaneko, H. ; Suzuki, H. ; Muranaka, T. ; Akimitsu, Jun. / X-ray diffraction study of MgB2 at low temperatures. In: Journal of Low Temperature Physics. 2005 ; Vol. 138, No. 5-6. pp. 1105-1115.
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