Wavelet analysis of x-ray diffraction pattern for glass structures

Yong Ding, Tokuro Nanba, Yoshinari Miura

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

A wavelet analysis of x-ray diffraction patterns is introduced for analyzing glass structures. The analysis indicates that within a short distance (∼0.8 nm for silica glass) atoms in the glass are arranged around the most probable positions which are almost as regular as the equilibrium positions in crystal. However, in glass the atomic distribution around the most probable position increases exponentially with increasing interatomic distance (exponentially damped regularity), whereas the crystal does not have this kind of damping. Beyond this distance, it is difficult to determine the structure in atomic scale due to the large atomic distribution. But, the analysis shows that the arrangement of quasiatomic planes in glass is still statistically regular (with damped regularity) up to an intermediate distance, e.g., 2.5-3.0 nm for silica glass. Then glass structure might be quantitatively determined by means of the structure of corresponding crystals and of the extent of the distributions around the most probable positions for atoms, as well as of the sizes of the structurally correlated group.

Original languageEnglish
Pages (from-to)14279-14287
Number of pages9
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume58
Issue number21
Publication statusPublished - Dec 1 1998

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Wavelet analysis
wavelet analysis
Diffraction patterns
x ray diffraction
diffraction patterns
X rays
Glass
glass
silica glass
Fused silica
regularity
Crystals
crystals
Atoms
atoms
Damping
damping

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Wavelet analysis of x-ray diffraction pattern for glass structures. / Ding, Yong; Nanba, Tokuro; Miura, Yoshinari.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 58, No. 21, 01.12.1998, p. 14279-14287.

Research output: Contribution to journalArticle

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