Abstract
A wavelength-scanning method is proposed to enable surface plasmon microscopes (SPMs) to determine the vertical position of a film. Currently, it is not possible for SPMs to spatially resolve the vertical position of a layer in a multilayered sample structure because the measured value is the effective refractive index (a weighted average of the different refractive indices over the entire sensing volume). We theoretically demonstrate that the vertical position of a layer can be estimated by exploiting the fact that the sensitivity of the effective refractive index depends on the distance from the substrate surface and the wavelength.
| Original language | English |
|---|---|
| Article number | 112401 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 51 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Nov 2012 |
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ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
Cite this
Wavelength-scanning method for identifying vertical position of film using surface plasmon microscopes. / Watanabe, Koyo; Matsuura, Koji.
In: Japanese Journal of Applied Physics, Vol. 51, No. 11, 112401, 11.2012.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Wavelength-scanning method for identifying vertical position of film using surface plasmon microscopes
AU - Watanabe, Koyo
AU - Matsuura, Koji
PY - 2012/11
Y1 - 2012/11
N2 - A wavelength-scanning method is proposed to enable surface plasmon microscopes (SPMs) to determine the vertical position of a film. Currently, it is not possible for SPMs to spatially resolve the vertical position of a layer in a multilayered sample structure because the measured value is the effective refractive index (a weighted average of the different refractive indices over the entire sensing volume). We theoretically demonstrate that the vertical position of a layer can be estimated by exploiting the fact that the sensitivity of the effective refractive index depends on the distance from the substrate surface and the wavelength.
AB - A wavelength-scanning method is proposed to enable surface plasmon microscopes (SPMs) to determine the vertical position of a film. Currently, it is not possible for SPMs to spatially resolve the vertical position of a layer in a multilayered sample structure because the measured value is the effective refractive index (a weighted average of the different refractive indices over the entire sensing volume). We theoretically demonstrate that the vertical position of a layer can be estimated by exploiting the fact that the sensitivity of the effective refractive index depends on the distance from the substrate surface and the wavelength.
UR - http://www.scopus.com/inward/record.url?scp=84869133115&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869133115&partnerID=8YFLogxK
U2 - 10.1143/JJAP.51.112401
DO - 10.1143/JJAP.51.112401
M3 - Article
AN - SCOPUS:84869133115
VL - 51
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 11
M1 - 112401
ER -