Verification of device model by measuring capacitance and static characteristics for predicting switching waveform

Kengo Koki, Masahiko Yoshioka, Kazuhiro Umetani, Eiji Hiraki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Verification of device model by measuring capacitance and static characteristics for predicting switching waveform'. Together they form a unique fingerprint.

Engineering & Materials Science