Variable stage-independent double sampling plan with screening for acceptance quality loss limit inspection scheme

Ikuo Arizono, Kazunori Yoshimoto, Ryosuke Tomohiro

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The quality loss suggested by Taguchi has been recognised as a new quality evaluation based on variable property instead of the quality evaluation based on traditional attribute property such as the proportion of nonconforming items. Some variable sampling inspection plans in order to assure the quality have been considered. As one of those sampling inspection plans, the single sampling plan with screening (SSPS) has been constructed for acceptance quality loss limit inspection scheme. Further, the repetitive group sampling plan with screening (RGSPS) has been developed for reducing the average total inspection (ATI). Although ATI by RGSPS has successfully been reduced in comparison with ATI by SSPS, RGSPS may sometimes increase the average sampling frequency (ASF) in return for reducing ATI. In this study, the stage-independent double sampling plan with screening (SIDSPS) based on the concept of the acceptance quality loss limit inspection scheme is proposed under the consideration of the trade-off between ATI and ASF. Through some numerical comparisons about ATI and ASF in SSPS, RGSPS, and SIDSPS, the usefulness of SIDSPS proposed in this study is confirmed.

Original languageEnglish
Pages (from-to)2550-2559
Number of pages10
JournalInternational Journal of Production Research
Volume58
Issue number8
DOIs
Publication statusPublished - Apr 17 2020

Keywords

  • Patnaik's approximation
  • acceptance quality loss limit inspection scheme
  • average total inspection
  • quality loss
  • stage-independent double sampling

ASJC Scopus subject areas

  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

Fingerprint Dive into the research topics of 'Variable stage-independent double sampling plan with screening for acceptance quality loss limit inspection scheme'. Together they form a unique fingerprint.

Cite this