Abstract
There are some conventional attribute sampling inspection plans designed with respect to attribute property, such as the proportion of nonconforming items. Among them, the attribute sampling inspection plans with screening are defined under the lot tolerance percent defective (LTPD) inspection scheme and the average outgoing quality limit (AOQL) inspection scheme. On one hand, Taguchi has proposed the concept of quality loss as a measure to evaluate the quality of items based on the variable property instead of the traditional attribute quality evaluation. Hereby, in this article, the design procedures for variable sampling inspection plans with screening indexed by Taguchis quality loss in conformity with the conventional attribute sampling inspection plans with screening composed of the LTPD and AOQL inspection schemes are represented.
Original language | English |
---|---|
Pages (from-to) | 405-418 |
Number of pages | 14 |
Journal | International Journal of Production Research |
Volume | 52 |
Issue number | 2 |
DOIs | |
Publication status | Published - Jan 17 2014 |
Keywords
- Patnaik's approximation
- Taguchi's quality loss
- Wilson-Hilferty approximation
- average total inspection
- rectifying inspection
ASJC Scopus subject areas
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering