Variable sampling inspection plans with screening indexed by Taguchis quality loss for optimising average total inspection

Ikuo Arizono, Takuma Miyazaki, Yasuhiko Takemoto

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

There are some conventional attribute sampling inspection plans designed with respect to attribute property, such as the proportion of nonconforming items. Among them, the attribute sampling inspection plans with screening are defined under the lot tolerance percent defective (LTPD) inspection scheme and the average outgoing quality limit (AOQL) inspection scheme. On one hand, Taguchi has proposed the concept of quality loss as a measure to evaluate the quality of items based on the variable property instead of the traditional attribute quality evaluation. Hereby, in this article, the design procedures for variable sampling inspection plans with screening indexed by Taguchis quality loss in conformity with the conventional attribute sampling inspection plans with screening composed of the LTPD and AOQL inspection schemes are represented.

Original languageEnglish
Pages (from-to)405-418
Number of pages14
JournalInternational Journal of Production Research
Volume52
Issue number2
DOIs
Publication statusPublished - Jan 17 2014

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Screening
Inspection
Sampling
Tolerance

Keywords

  • average total inspection
  • Patnaik's approximation
  • rectifying inspection
  • Taguchi's quality loss
  • Wilson-Hilferty approximation

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research
  • Strategy and Management

Cite this

Variable sampling inspection plans with screening indexed by Taguchis quality loss for optimising average total inspection. / Arizono, Ikuo; Miyazaki, Takuma; Takemoto, Yasuhiko.

In: International Journal of Production Research, Vol. 52, No. 2, 17.01.2014, p. 405-418.

Research output: Contribution to journalArticle

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