Variable sampling inspection plans with screening indexed by Taguchis quality loss for optimising average total inspection

Ikuo Arizono, Takuma Miyazaki, Yasuhiko Takemoto

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

There are some conventional attribute sampling inspection plans designed with respect to attribute property, such as the proportion of nonconforming items. Among them, the attribute sampling inspection plans with screening are defined under the lot tolerance percent defective (LTPD) inspection scheme and the average outgoing quality limit (AOQL) inspection scheme. On one hand, Taguchi has proposed the concept of quality loss as a measure to evaluate the quality of items based on the variable property instead of the traditional attribute quality evaluation. Hereby, in this article, the design procedures for variable sampling inspection plans with screening indexed by Taguchis quality loss in conformity with the conventional attribute sampling inspection plans with screening composed of the LTPD and AOQL inspection schemes are represented.

Original languageEnglish
Pages (from-to)405-418
Number of pages14
JournalInternational Journal of Production Research
Volume52
Issue number2
DOIs
Publication statusPublished - Jan 17 2014

Keywords

  • Patnaik's approximation
  • Taguchi's quality loss
  • Wilson-Hilferty approximation
  • average total inspection
  • rectifying inspection

ASJC Scopus subject areas

  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

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