TY - GEN
T1 - Two-port Noise Source Equivalent Circuit Model for DC/DC Buck Converter with Consideration of Load Effect
AU - Zhang, Shuqi
AU - Uematsu, Taishi
AU - Iokibe, Kengo
AU - Toyota, Yoshitaka
N1 - Funding Information:
This work was partially supported by JSPS KAKENHI Grant Number 16H04318.
PY - 2020/9/23
Y1 - 2020/9/23
N2 - As the conducted disturbance of a power converter changes with its load value, the relationship between the electromagnetic interference of the power converter and its load needs to be investigated. This work examines a 2-port equivalent circuit model for a DC/DC buck converter with consideration of the load effect. Factors that influence the model accuracy are also discussed. We used a synchronous buck converter operating under a continuous conduction mode condition to determine the load effect and evaluate the model. Results showed that the input port of the fixed-load model and load-variable model had good accuracy up to 70 MHz. We also predicted the load effect on input port noise and found that the input port noise of an 8.2-? load could be predicted from the other two load values (6.6 ? and 11.6 ?).
AB - As the conducted disturbance of a power converter changes with its load value, the relationship between the electromagnetic interference of the power converter and its load needs to be investigated. This work examines a 2-port equivalent circuit model for a DC/DC buck converter with consideration of the load effect. Factors that influence the model accuracy are also discussed. We used a synchronous buck converter operating under a continuous conduction mode condition to determine the load effect and evaluate the model. Results showed that the input port of the fixed-load model and load-variable model had good accuracy up to 70 MHz. We also predicted the load effect on input port noise and found that the input port noise of an 8.2-? load could be predicted from the other two load values (6.6 ? and 11.6 ?).
KW - DC/DC buck converter
KW - EMI prediction
KW - black-box method
KW - load effect
UR - http://www.scopus.com/inward/record.url?scp=85097131300&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85097131300&partnerID=8YFLogxK
U2 - 10.1109/EMCEUROPE48519.2020.9245680
DO - 10.1109/EMCEUROPE48519.2020.9245680
M3 - Conference contribution
AN - SCOPUS:85097131300
T3 - Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
BT - Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
Y2 - 23 September 2020 through 25 September 2020
ER -