Tunneling picture of interlayer magnetotransport in multilayer systems

Toshihito Osada, Masahiko Kuraguchi, Kaya Kobayashi, Eiji Ohmichi

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Interlayer magnetotransport of multilayer systems has been generally studied. In multilayer systems with weak interlayer coupling, interlayer conduction is mainly dominated by single tunneling process between neighboring layers. The selection rule and probability of single interlayer tunneling are controlled by orientation and strength of magnetic fields. This tunneling model gives the most general explanation of most of the magnetoresistance angular effects observed in Q2D or Q1D layered conductors. The existence of the Fermi surface is not necessary for appearance of them. This model can also be applied to the modified angular effects under strong electric fields.

Original languageEnglish
Pages (from-to)200-201
Number of pages2
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume18
Issue number1-3
DOIs
Publication statusPublished - May 2003
Externally publishedYes

Fingerprint

Galvanomagnetic effects
interlayers
Multilayers
Fermi surface
Magnetoresistance
Electric fields
Magnetic fields
Fermi surfaces
conductors
conduction
electric fields
magnetic fields

Keywords

  • Angular-dependent magnetoresistance oscillations
  • Incoherent transport
  • Interlayer tunneling
  • Low-dimensional conductor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Tunneling picture of interlayer magnetotransport in multilayer systems. / Osada, Toshihito; Kuraguchi, Masahiko; Kobayashi, Kaya; Ohmichi, Eiji.

In: Physica E: Low-Dimensional Systems and Nanostructures, Vol. 18, No. 1-3, 05.2003, p. 200-201.

Research output: Contribution to journalArticle

Osada, Toshihito ; Kuraguchi, Masahiko ; Kobayashi, Kaya ; Ohmichi, Eiji. / Tunneling picture of interlayer magnetotransport in multilayer systems. In: Physica E: Low-Dimensional Systems and Nanostructures. 2003 ; Vol. 18, No. 1-3. pp. 200-201.
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