Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field

Tadashi Shiota, M. Tagawa, M. Umeno, N. Ohmae

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.

Original languageEnglish
Pages (from-to)6811-6815
Number of pages5
JournalJournal of Applied Physics
Volume85
Issue number9
DOIs
Publication statusPublished - May 1 1999
Externally publishedYes

Fingerprint

tungsten
stimulated emission
field emission
electric fields
interruption
electric potential
electron emission
temperature distribution
moments
temperature dependence
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field. / Shiota, Tadashi; Tagawa, M.; Umeno, M.; Ohmae, N.

In: Journal of Applied Physics, Vol. 85, No. 9, 01.05.1999, p. 6811-6815.

Research output: Contribution to journalArticle

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