Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field

T. Shiota; M. Tagawa; M. Umeno; N. Ohmae

doi:10.1063/1.370198

Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field

T. Shiota, M. Tagawa, M. Umeno, N. Ohmae

Research output: Contribution to journal › Article

2 Citations (Scopus)

Abstract

The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.

Original language	English
Pages (from-to)	6811-6815
Number of pages	5
Journal	Journal of Applied Physics
Volume	85
Issue number	9
DOIs	https://doi.org/10.1063/1.370198
Publication status	Published - May 1 1999
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field",

abstract = "The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.",

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T1 - Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field

AU - Shiota, T.

AU - Tagawa, M.

AU - Umeno, M.

AU - Ohmae, N.

PY - 1999/5/1

Y1 - 1999/5/1

N2 - The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.

AB - The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.

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