Abstract
The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.
| Original language | English |
|---|---|
| Pages (from-to) | 6811-6815 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 85 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - May 1 1999 |
| Externally published | Yes |
Fingerprint
ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field. / Shiota, Tadashi; Tagawa, M.; Umeno, M.; Ohmae, N.
In: Journal of Applied Physics, Vol. 85, No. 9, 01.05.1999, p. 6811-6815.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Transient exoelectron emission from a clean tungsten tip at 200-450 K triggered by the surface electric field
AU - Shiota, Tadashi
AU - Tagawa, M.
AU - Umeno, M.
AU - Ohmae, N.
PY - 1999/5/1
Y1 - 1999/5/1
N2 - The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.
AB - The temperature dependence of field-stimulated exoelectron emission (FSEE) on a clean W tip was investigated. The increase of the electron emission at the moment of reapplication of the tip voltage was observed at the temperatures 200-450 K. This emission property was similar to the storage effect of exoelectron emission from Al tips reported previously. [Appl. Phys. Lett. 53, 626 (1988).] However, the emission intensity was independent of the voltage interruption period. The change in work function was also indicated at the temperature where FSEE was observed. The FSEE on W tips observed in this study was explained by the exoelectron emission during the surface reconstruction of W{001} and/or W{031} triggered by the high electric field.
UR - http://www.scopus.com/inward/record.url?scp=0346601786&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0346601786&partnerID=8YFLogxK
U2 - 10.1063/1.370198
DO - 10.1063/1.370198
M3 - Article
AN - SCOPUS:0346601786
VL - 85
SP - 6811
EP - 6815
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 9
ER -