TY - GEN
T1 - Total-Ionizing-Dose Tolerance of the configuration function of MAX3000A CPLDs
AU - Fujimori, Takumi
AU - Watanabe, Minoru
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/9
Y1 - 2018/9
N2 - Recently, space-grade radiation-hardened SRAM-based field programmable gate arrays (FPGAs) have become available. However, since the configuration memory of SRAM-based FPGAs is sensitive to damage by radiation, flash-based FP-GAs and complex programmable logic devices (CPLDs) are frequently used for space systems instead of SRAM-based FPGAs. Although flash-based FPGAs and CPLDs are programmable devices, the configuration memory of them is somewhat robust against radiation. This paper presents experimentally obtained result of the total-ionizing-dose tolerance of the configuration function of a CPLD or MAX3000A (EPM3128ATC100-10; Intel Corp.). The total-ionizing-dose tolerances of the configuration function of six MAX3000A chips have been measured using an approximately 30 TBq 60Co gamma radiation source with emissions up to 50 krad.
AB - Recently, space-grade radiation-hardened SRAM-based field programmable gate arrays (FPGAs) have become available. However, since the configuration memory of SRAM-based FPGAs is sensitive to damage by radiation, flash-based FP-GAs and complex programmable logic devices (CPLDs) are frequently used for space systems instead of SRAM-based FPGAs. Although flash-based FPGAs and CPLDs are programmable devices, the configuration memory of them is somewhat robust against radiation. This paper presents experimentally obtained result of the total-ionizing-dose tolerance of the configuration function of a CPLD or MAX3000A (EPM3128ATC100-10; Intel Corp.). The total-ionizing-dose tolerances of the configuration function of six MAX3000A chips have been measured using an approximately 30 TBq 60Co gamma radiation source with emissions up to 50 krad.
UR - http://www.scopus.com/inward/record.url?scp=85100460945&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85100460945&partnerID=8YFLogxK
U2 - 10.1109/RADECS45761.2018.9328682
DO - 10.1109/RADECS45761.2018.9328682
M3 - Conference contribution
AN - SCOPUS:85100460945
T3 - 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018
BT - 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018
Y2 - 16 September 2018 through 21 September 2018
ER -