Total-ionizing-dose tolerance evaluation of an optoelectronic field programmable gate array VLSI during operation

Hirotoshi Ito, Minoru Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the total-ionizing-dose tolerance evaluation of an optoelectronic field programmable gate array (FPGA) during operation. The optoelectronic FPGA was fabricated using 0.18 µ m standard complementary metal oxide semiconductor (CMOS) process technology. An experiment assessing the total-ionizing-dose tolerance of the optoelectronic FPGA was conducted at a 2.27-2.28 kGy/h dose rate using a60 Co gamma radiation source. Results clarified that the optoelectronic FPGA can function correctly under a 2.27-2.28 kGy/h dose rate and that the total-ionizing-dose tolerance of the optoelectronic FPGA is greater than 80 Mrad during operation. The total-ionizing-dose tolerance result is 80 times higher than that of typical radiation-hardened very large scale integrated circuits (VLSIs) and typical radiation-hardened FPGAs.

Original languageEnglish
Title of host publication2021 International Conference on Field-Programmable Technology, ICFPT 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665420105
DOIs
Publication statusPublished - 2021
Event20th International Conference on Field-Programmable Technology, ICFPT 2021 - Virtual, Auckland, New Zealand
Duration: Dec 6 2021Dec 10 2021

Publication series

Name2021 International Conference on Field-Programmable Technology, ICFPT 2021

Conference

Conference20th International Conference on Field-Programmable Technology, ICFPT 2021
Country/TerritoryNew Zealand
CityVirtual, Auckland
Period12/6/2112/10/21

Keywords

  • Field programmable gate arrays
  • optical interconnections
  • optoelectronic devices
  • radiation
  • total-ionizing-dose tolerance

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Software

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