Total ionizing dose effects of optical components on an optically reconfigurable gate array

Retsu Moriwaki, Hiroyuki Ito, Kouta Akagi, Minoru Watanabe, Akifumi Ogiwara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, optically reconfigurable gate arrays (ORGAs) have been developed as radiation-hardened field programmable gate arrays (FPGAs) to realize a 10 Mrad total ionizing dose-tolerance. Specifically, ORGAs offer important benefits of high-speed reconfiguration, numerous reconfiguration contexts, and robust configuration. These three factors are important to remove the soft-error of a configuration circuit on a programmable gate array and to increase the total ionizing dose tolerance. Although the robust configuration capability has been confirmed using radiation emulation, no actual radiation experiment has been reported to date in the relevant literature. This paper therefore presents experiments demonstrating the enhanced radiation tolerance of an optically reconfigurable gate array using a cobalt-60 gamma radiation source.

Original languageEnglish
Title of host publicationApplied Reconfigurable Computing - 11th International Symposium, ARC 2015, Proceedings
EditorsPedro C. Diniz, Kentaro Sano, Michael Hübner, Dimitrios Soudris
PublisherSpringer Verlag
Pages393-400
Number of pages8
ISBN (Electronic)9783319162133
DOIs
Publication statusPublished - 2015
Externally publishedYes
Event11th International Symposium on Applied Reconfigurable Computing, ARC 2015 - Bochum, Germany
Duration: Apr 13 2015Apr 17 2015

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume9040
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference11th International Symposium on Applied Reconfigurable Computing, ARC 2015
Country/TerritoryGermany
CityBochum
Period4/13/154/17/15

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science(all)

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