Time-resolved pair distribution function analysis of disordered materials on beamlines BL04B2 and BL08W at SPring-8

Koji Ohara, Satoshi Tominaka, Hiroki Yamada, Masakuni Takahashi, Hiroshi Yamaguchi, Futoshi Utsuno, Takashi Umeki, Atsushi Yao, Kengo Nakada, Michitaka Takemoto, Satoshi Hiroi, Naruki Tsuji, Toru Wakihara

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

A dedicated apparatus has been developed for studying structural changes in amorphous and disordered crystalline materials substantially in real time. The apparatus, which can be set up on beamlines BL04B2 and BL08W at SPring-8, mainly consists of a large two-dimensional flat-panel detector and high-energy X-rays, enabling total scattering measurements to be carried out for time-resolved pair distribution function (PDF) analysis in the temperature range from room temperature to 873 K at pressures of up to 20 bar. For successful time-resolved analysis, a newly developed program was used that can monitor and process two-dimensional image data simultaneously with the data collection. The use of time-resolved hardware and software is of great importance for obtaining a detailed understanding of the structural changes in disordered materials, as exemplified by the results of commissioned measurements carried out on both beamlines. Benchmark results obtained using amorphous silica and demonstration results for the observation of sulfide glass crystallization upon annealing are introduced.

Original languageEnglish
Pages (from-to)1627-1633
Number of pages7
JournalJournal of Synchrotron Radiation
Volume25
Issue number6
DOIs
Publication statusPublished - Nov 2018
Externally publishedYes

Keywords

  • beamlines
  • crystallization
  • disordered materials
  • pair distribution functions
  • time-resolved measurements

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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