Three-dimensional identification of semi-elliptical crack on the back surface by means of direct-current electrical potential difference method with multiple-probe sensor

Naoya Tada, Akira Funakoshi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method of three-dimensional identification of a semielliptical crack existing on the back surface of a conductive plate by direct-current electrical potential difference method with a multiple-probe sensor was proposed. The geometrical condition of the crack was specified by six parameters, the surface and inward angles of the crack plane, θsur and θin, the length and depth of the crack, c and a, and the two-dimensional location of the crack center, (yc, zc), on the back surface, respectively. Identification was carried out based on the distribution of electrical potential difference on the surface of the plate measured with a sensor composed of grid-arranged multiple probes called the "multiple-probe sensor." As an approximate cracked body and a quick analysis method were used, a number of repeated electrical potential field analyses necessary for the identification of the crack became possible within a practical time. The validity of the method was numerically confirmed by carrying out the identification based on the result by the finite element analysis.

Original languageEnglish
Title of host publicationAmerican Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP
Volume2006
DOIs
Publication statusPublished - 2006
EventASME PVP2006/ICPVT-11 Conference - Vancouver, BC, Canada
Duration: Jul 23 2006Jul 27 2006

Other

OtherASME PVP2006/ICPVT-11 Conference
CountryCanada
CityVancouver, BC
Period7/23/067/27/06

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ASJC Scopus subject areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

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