Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM

Toshiyuki Taniuchi, Ryutaro Yasuhara, Hiroshi Kumigashira, Masato Kubota, Hiroyuki Okazaki, Takanori Wakita, Takanori Yokoya, Kanta Ono, Masaharu Oshima, Mikk Lippmaa, Masashi Kawasaki, Hideomi Koinuma

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

We have used photoelectron emission microscopy (PEEM) and X-ray magnetic circular dichroism (XMCD) to study the effect of thin film thickness on the magnetic domain formation in La0.6Sr0.4MnO3 samples that were epitaxially grown on stepped SrTiO3 (0 0 1) substrates. The magnetic image exhibited a stripe structure elongated along the step direction, irrespective of film thickness, suggesting that uniaxial magnetic anisotropy induced by step-and-terrace structures plays an important role in the magnetic domain formation. Additional domains evolved gradually with increasing film thickness. In these domains, the direction of magnetization differed from the step direction due to biaxial magneto-crystalline anisotropy. The evolution of additional magnetic domains with increasing film thickness implies that a competition exists between the two anisotropies in LSMO films.

Original languageEnglish
Pages (from-to)4690-4693
Number of pages4
JournalSurface Science
Volume601
Issue number20 SPEC. ISS.
DOIs
Publication statusPublished - Oct 15 2007

Fingerprint

Magnetic domains
Epitaxial films
Dichroism
magnetic domains
Photoelectrons
dichroism
Film thickness
Microscopic examination
photoelectrons
film thickness
microscopy
X rays
Thin films
thin films
anisotropy
Anisotropy
x rays
Magnetic anisotropy
Magnetization
Crystalline materials

Keywords

  • Magnetic domain
  • Manganite
  • PEEM
  • Spintronics
  • Thin film
  • XMCD

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Taniuchi, T., Yasuhara, R., Kumigashira, H., Kubota, M., Okazaki, H., Wakita, T., ... Koinuma, H. (2007). Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM. Surface Science, 601(20 SPEC. ISS.), 4690-4693. https://doi.org/10.1016/j.susc.2007.05.036

Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM. / Taniuchi, Toshiyuki; Yasuhara, Ryutaro; Kumigashira, Hiroshi; Kubota, Masato; Okazaki, Hiroyuki; Wakita, Takanori; Yokoya, Takanori; Ono, Kanta; Oshima, Masaharu; Lippmaa, Mikk; Kawasaki, Masashi; Koinuma, Hideomi.

In: Surface Science, Vol. 601, No. 20 SPEC. ISS., 15.10.2007, p. 4690-4693.

Research output: Contribution to journalArticle

Taniuchi, T, Yasuhara, R, Kumigashira, H, Kubota, M, Okazaki, H, Wakita, T, Yokoya, T, Ono, K, Oshima, M, Lippmaa, M, Kawasaki, M & Koinuma, H 2007, 'Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM', Surface Science, vol. 601, no. 20 SPEC. ISS., pp. 4690-4693. https://doi.org/10.1016/j.susc.2007.05.036
Taniuchi, Toshiyuki ; Yasuhara, Ryutaro ; Kumigashira, Hiroshi ; Kubota, Masato ; Okazaki, Hiroyuki ; Wakita, Takanori ; Yokoya, Takanori ; Ono, Kanta ; Oshima, Masaharu ; Lippmaa, Mikk ; Kawasaki, Masashi ; Koinuma, Hideomi. / Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD-PEEM. In: Surface Science. 2007 ; Vol. 601, No. 20 SPEC. ISS. pp. 4690-4693.
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