The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction

Tetsuo Irifune, Norimasa Nishiyama, Koji Kuroda, Toru Inoue, Maiko Isshiki, Wataru Utsumi, Ken Ichi Funakoshi, Satoru Urakawa, Takeyuki Uchida, Tomoo Katsura, Osamu Ohtaka

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Abstract

The phase boundary between spinel (γ phase) and MgSiO3 perovskite + MgO periclase in Mg2SiO4 was determined by in situ x-ray measurements by a combination of the synchrotron radiation source (SPring-8) and a large multianvil high-pressure apparatus. The boundary was determined at temperatures between 1400°to 1800°C, demonstrating that the postspinel phase boundary has a negative Clapeyron slope as estimated by quench experiments and thermodynamic analyses. The boundary was located at 21.1 (± 0.2) gigapascals, at 1600°C, which is ~2 gigapascals lower than earlier estimates based on other high-pressure studies.

Original languageEnglish
Pages (from-to)1698-1700
Number of pages3
JournalScience
Volume279
Issue number5357
DOIs
Publication statusPublished - Mar 13 1998

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Irifune, T., Nishiyama, N., Kuroda, K., Inoue, T., Isshiki, M., Utsumi, W., Funakoshi, K. I., Urakawa, S., Uchida, T., Katsura, T., & Ohtaka, O. (1998). The postspinel phase boundary in Mg2SiO4 determined by in situ X-ray diffraction. Science, 279(5357), 1698-1700. https://doi.org/10.1126/science.279.5357.1698