TY - JOUR
T1 - The electronic structure and energy level alignment of porphyrin/metal interfaces studied by ultraviolet photoelectron spectroscopy
AU - Narioka, S.
AU - Ishii, H.
AU - Yoshimura, D.
AU - Sei, M.
AU - Ouchi, Y.
AU - Seki, K.
AU - Hasegawa, S.
AU - Miyazaki, T.
AU - Harima, Y.
AU - Yamashita, K.
N1 - Funding Information:
We thank ProfessorY oshio Umemorfi or the instructionasb ouDt DQ treatmenTth. isw orkw as supporteidn partb y the Grant-Aidsfo r Scientific Researcfhr omt heM inistryo fE ducationS,c ience, andC ultureo f Japan( Nos.0 44030010,6 NP0301). This work was performeda s a Joint Studies Programo f UVSOR facility of the Institutef or MoleculaSr cience(N o.6-H217).
PY - 1995
Y1 - 1995
N2 - Electronic structures of 5, 10, 15, 20-zinctetraphenylporphyrin (ZnTPP)/metal (Au, Ag, Al, Mg) interfaces prepared in ultrahigh vacuum were investigated by ultraviolet photoelectron spectroscopy (UPS). We found that the electronic energy levels of ZnTPP align to the vacuum level of substrate metal, with a constant energy shift of vacuum levels across the interface. These findings cannot be explained by the simple models assuming vacuum level alignment at the interface. We also found that sample exposure to oxygen induces energy level shift in close relation with change of substrate work function at oxygen exposure.
AB - Electronic structures of 5, 10, 15, 20-zinctetraphenylporphyrin (ZnTPP)/metal (Au, Ag, Al, Mg) interfaces prepared in ultrahigh vacuum were investigated by ultraviolet photoelectron spectroscopy (UPS). We found that the electronic energy levels of ZnTPP align to the vacuum level of substrate metal, with a constant energy shift of vacuum levels across the interface. These findings cannot be explained by the simple models assuming vacuum level alignment at the interface. We also found that sample exposure to oxygen induces energy level shift in close relation with change of substrate work function at oxygen exposure.
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U2 - 10.1063/1.114370
DO - 10.1063/1.114370
M3 - Article
AN - SCOPUS:0000664458
VL - 67
SP - 1899
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
ER -