| Original language | English |
|---|---|
| Pages (from-to) | 10-10 |
| Number of pages | 1 |
| Journal | The Transactions of IEICE Japan |
| Volume | J74-D-1 |
| Publication status | Published - 1991 |
Test Generation for Sequencers of Processor Control Circuits
Yuuji Sugiyama
Research output: Contribution to journal › Article