Test Generation for Sequencers of Processor Control Circuits

Yuuji Sugiyama

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)10-10
Number of pages1
JournalThe Transactions of IEICE Japan
VolumeJ74-D-1
Publication statusPublished - 1991

Cite this

Test Generation for Sequencers of Processor Control Circuits. / Sugiyama, Yuuji.

In: The Transactions of IEICE Japan, Vol. J74-D-1, 1991, p. 10-10.

Research output: Contribution to journalArticle

@article{3e989a1a51a0410785530f0fdea3b1bf,
title = "Test Generation for Sequencers of Processor Control Circuits",
author = "Yuuji Sugiyama",
year = "1991",
language = "English",
volume = "J74-D-1",
pages = "10--10",
journal = "The Transactions of IEICE Japan",

}

TY - JOUR

T1 - Test Generation for Sequencers of Processor Control Circuits

AU - Sugiyama, Yuuji

PY - 1991

Y1 - 1991

M3 - Article

VL - J74-D-1

SP - 10

EP - 10

JO - The Transactions of IEICE Japan

JF - The Transactions of IEICE Japan

ER -