Abstract
Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.
| Original language | English |
|---|---|
| Title of host publication | Optical Terahertz Science and Technology, OTST 2005 |
| Publisher | Optical Society of America (OSA) |
| ISBN (Print) | 1557527865, 9781557527868 |
| DOIs | |
| Publication status | Published - 2005 |
| Event | Optical Terahertz Science and Technology, OTST 2005 - Orlando, FL, United States Duration: Mar 14 2005 → Mar 14 2005 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| ISSN (Electronic) | 2162-2701 |
Other
| Other | Optical Terahertz Science and Technology, OTST 2005 |
|---|---|
| Country | United States |
| City | Orlando, FL |
| Period | 3/14/05 → 3/14/05 |
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics
Fingerprint Dive into the research topics of 'Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors'. Together they form a unique fingerprint.
Cite this
Kiwa, T., Tsukada, K., Suzuki, M., Tonouchi, M., Migitaka, S., & Yokosawa, K. (2005). Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. In Optical Terahertz Science and Technology, OTST 2005 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/otst.2005.tud7