Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors

Toshihiko Kiwa, Keiji Tsukada, M. Suzuki, M. Tonouchi, S. Migitaka, K. Yokosawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.

Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557527865, 9781557527868
Publication statusPublished - 2005
EventOptical Terahertz Science and Technology, OTST 2005 - Orlando, FL, United States
Duration: Mar 14 2005Mar 14 2005

Other

OtherOptical Terahertz Science and Technology, OTST 2005
CountryUnited States
CityOrlando, FL
Period3/14/053/14/05

Fingerprint

Semiconductor materials
Hydrogen
sensors
Sensors
hydrogen
Metals
metals
nondestructive tests
Gases
gases

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Kiwa, T., Tsukada, K., Suzuki, M., Tonouchi, M., Migitaka, S., & Yokosawa, K. (2005). Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. In Optics InfoBase Conference Papers Optical Society of America.

Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. / Kiwa, Toshihiko; Tsukada, Keiji; Suzuki, M.; Tonouchi, M.; Migitaka, S.; Yokosawa, K.

Optics InfoBase Conference Papers. Optical Society of America, 2005.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kiwa, T, Tsukada, K, Suzuki, M, Tonouchi, M, Migitaka, S & Yokosawa, K 2005, Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. in Optics InfoBase Conference Papers. Optical Society of America, Optical Terahertz Science and Technology, OTST 2005, Orlando, FL, United States, 3/14/05.
Kiwa T, Tsukada K, Suzuki M, Tonouchi M, Migitaka S, Yokosawa K. Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. In Optics InfoBase Conference Papers. Optical Society of America. 2005
Kiwa, Toshihiko ; Tsukada, Keiji ; Suzuki, M. ; Tonouchi, M. ; Migitaka, S. ; Yokosawa, K. / Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. Optics InfoBase Conference Papers. Optical Society of America, 2005.
@inproceedings{4cfc541e70d64df48c58bc744a54293a,
title = "Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors",
abstract = "Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.",
author = "Toshihiko Kiwa and Keiji Tsukada and M. Suzuki and M. Tonouchi and S. Migitaka and K. Yokosawa",
year = "2005",
language = "English",
isbn = "1557527865",
booktitle = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America",

}

TY - GEN

T1 - Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors

AU - Kiwa, Toshihiko

AU - Tsukada, Keiji

AU - Suzuki, M.

AU - Tonouchi, M.

AU - Migitaka, S.

AU - Yokosawa, K.

PY - 2005

Y1 - 2005

N2 - Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.

AB - Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.

UR - http://www.scopus.com/inward/record.url?scp=84899829486&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899829486&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84899829486

SN - 1557527865

SN - 9781557527868

BT - Optics InfoBase Conference Papers

PB - Optical Society of America

ER -