Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors

T. Kiwa, K. Tsukada, M. Suzuki, M. Tonouchi, S. Migitaka, K. Yokosawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Terahertz emission properties of catalytic-metal/semiconductor structures under hydrogen gas were investigated for non-contact and non-destructive test of hydrogen sensors. The peak amplitude of terahertz from the samples decreases with increasing the hydrogen concentration.

Original languageEnglish
Title of host publicationOptical Terahertz Science and Technology, OTST 2005
PublisherOptical Society of America
ISBN (Print)1557527865, 9781557527868
Publication statusPublished - Jan 1 2005
EventOptical Terahertz Science and Technology, OTST 2005 - Orlando, FL, United States
Duration: Mar 14 2005Mar 14 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Terahertz Science and Technology, OTST 2005
CountryUnited States
CityOrlando, FL
Period3/14/053/14/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Kiwa, T., Tsukada, K., Suzuki, M., Tonouchi, M., Migitaka, S., & Yokosawa, K. (2005). Terahertz emission from catalytic-metal/semiconductor interface of hydrogen sensors. In Optical Terahertz Science and Technology, OTST 2005 (Optics InfoBase Conference Papers). Optical Society of America.