Temperature dependence of EXAFS spectrum in BiPbSrCaCu oxide superconductor

Akihisa Koizumi, Hiroshi Maruyama, Hitoshi Yamazaki, Hironobu Maeda, Tadao Ishii, Yoshinari Miura, Jun Takada

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Temperature dependence of extended X-ray absorption fine structure (EXAFS) is studied in the high-Tc BiPbSrCa Cu oxide superconductor. Measurements were made at the Cu K-edge in the temperature range from 26.9 to 300 K. Interatomic distances and mean square relative displacement (MSRD: σ(2) of CuO bonds are determined by the least-squares refinement. An anomalous increase in the axial component of the MSRD is found near Tc while its equatorial component decreases normally with decreasing temperature.

Original languageEnglish
Pages (from-to)338-344
Number of pages7
JournalPhysica C: Superconductivity and its applications
Volume190
Issue number3
DOIs
Publication statusPublished - Jan 1 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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    Koizumi, A., Maruyama, H., Yamazaki, H., Maeda, H., Ishii, T., Miura, Y., & Takada, J. (1992). Temperature dependence of EXAFS spectrum in BiPbSrCaCu oxide superconductor. Physica C: Superconductivity and its applications, 190(3), 338-344. https://doi.org/10.1016/0921-4534(92)90616-K