Abstract
The pyrochlore type of MgZrSi2O7 was synthesized at 25 GPa and 1500 °C using a Kawai-type, multi-anvil apparatus. Powder X-ray diffraction and Rietveld analysis revealed that the phase assumed the pyrochlore structure (space group Fd3̄m, cubic) with the lattice parameter a = 9.2883(1) and the structural parameter x = 0.4295(4). Chemical analysis by the electron probe microanalysis (EPMA) confirmed the stoichiometry of MgZrSi 2O7. It was demonstrated that the eight-fold coordinated 16c site is randomly occupied by both Mg2+ and Zr4+ ions in a 1:1 ratio. The high ionic radius ratio RA/RB (where A and B denote Mg + Zr and Si, respectively) of 2.22 necessitates a relatively high pressure to stabilize the pyrochlore structure.
Original language | English |
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Pages (from-to) | 410-412 |
Number of pages | 3 |
Journal | Materials Chemistry and Physics |
Volume | 128 |
Issue number | 3 |
DOIs | |
Publication status | Published - Aug 15 2011 |
Keywords
- Chemical synthesis
- Crystal structure
- Powder diffraction
- Rietveld analysis
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics