Synchrotron x-ray diffraction study of a charge stripe order in (formula presented)-doped (formula presented)

M. Fujita, H. Kimura, Y. Noda, K. Yamada, H. Goka, Naoshi Ikeda

Research output: Contribution to journalArticle

Abstract

Lattice distortions associated with charge stripe order in (formula presented) hole-doped (formula presented) are studied using synchrotron x-ray diffraction for (formula presented) and (formula presented) The propagation wave-vector and charge order correlation lengths are determined with a high accuracy, revealing that the oblique charge stripes in orthorhombic (formula presented) crystal are more disordered than the aligned stripes in tetragonal (formula presented) crystal. The twofold periodicity of lattice modulations along the c axis is explained by long-range Coulomb interactions between holes on neighboring (formula presented) planes.

Original languageEnglish
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume67
Issue number14
DOIs
Publication statusPublished - Apr 22 2003
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this