Study on the physical properties of Na4C60

Yasuhiro Takabayashi, Yoshihiro Kubozono, Satoshi Fujiki, Setsuo Kashino, Kenji Ishii, Hiroyoshi Suematsu, Hironori Ogata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Temperature dependence of resistivity, ρ, of a two-dimensional polymer phase of Na4C60 has been studied from 190 to 300 K. The ρ was 6.9×103 Ω cm at 300 K, which is higher by six orders than those of metallic fullerides. The temperature dependence of ρ shows a semiconducting behavior in this temperature region. This result is different from the previous result derived from ESR which suggests a metallic property above 100 K. The gap energy, Eg, was estimated to be 0.8 eV. This value is close to those of other A4C60 (A:K, Rb and Cs).

Original languageEnglish
Title of host publicationNanonetwork Materials
Subtitle of host publicationFullerenes, Nanotubes, and Related Systems
EditorsTsuneya Ando, Yoshihiro Iwasawa, Koichi Kikuchi, Yahachi Saito, Susumu Saito, Mototada Kobayashi
PublisherAmerican Institute of Physics Inc.
Pages345-348
Number of pages4
ISBN (Electronic)0735400326, 9780735400320
DOIs
Publication statusPublished - Oct 16 2001
EventInternational Symposium on Nanonetwork Materials: Fullerenes, Nanotubes, and Related Systems 2001 - Kamakura, Japan
Duration: Jan 15 2001Jan 18 2001

Publication series

NameAIP Conference Proceedings
Volume590
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherInternational Symposium on Nanonetwork Materials: Fullerenes, Nanotubes, and Related Systems 2001
CountryJapan
CityKamakura
Period1/15/011/18/01

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Takabayashi, Y., Kubozono, Y., Fujiki, S., Kashino, S., Ishii, K., Suematsu, H., & Ogata, H. (2001). Study on the physical properties of Na4C60. In T. Ando, Y. Iwasawa, K. Kikuchi, Y. Saito, S. Saito, & M. Kobayashi (Eds.), Nanonetwork Materials: Fullerenes, Nanotubes, and Related Systems (pp. 345-348). (AIP Conference Proceedings; Vol. 590). American Institute of Physics Inc.. https://doi.org/10.1063/1.1420123