Study of PPDs with multi-wavelength laser microscope system

Koji Yoshimura, Isamu Nakamura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.

Original languageEnglish
Title of host publicationProceedings of Science
Publication statusPublished - 2012
Externally publishedYes
Event3rd International Workshop on New Photon-Detectors, PhotoDet 2012 - Orsay, France
Duration: Jun 13 2012Jun 15 2012

Other

Other3rd International Workshop on New Photon-Detectors, PhotoDet 2012
CountryFrance
CityOrsay
Period6/13/126/15/12

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ASJC Scopus subject areas

  • General

Cite this

Yoshimura, K., & Nakamura, I. (2012). Study of PPDs with multi-wavelength laser microscope system. In Proceedings of Science