Study of PPDs with multi-wavelength laser microscope system

Koji Yoshimura; Isamu Nakamura

Study of PPDs with multi-wavelength laser microscope system

Research output: Contribution to journal › Conference article › peer-review

Abstract

Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.

Original language	English
Journal	Proceedings of Science
Publication status	Published - Dec 1 2012
Externally published	Yes
Event	3rd International Workshop on New Photon-Detectors, PhotoDet 2012 - Orsay, France Duration: Jun 13 2012 → Jun 15 2012

ASJC Scopus subject areas

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title = "Study of PPDs with multi-wavelength laser microscope system",

abstract = "Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.",

author = "Koji Yoshimura and Isamu Nakamura",

year = "2012",

month = dec,

day = "1",

language = "English",

journal = "Proceedings of Science",

issn = "1824-8039",

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note = "3rd International Workshop on New Photon-Detectors, PhotoDet 2012 ; Conference date: 13-06-2012 Through 15-06-2012",

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AU - Yoshimura, Koji

AU - Nakamura, Isamu

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N2 - Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.

AB - Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have been developing a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ∼ 2 μm, small enough to measure pixel-by-pixel performance of PPD. Based on the feedback from commissioning, we have made several improvements which are essential for further detailed studies of the PPD. In this report, we will report improvements of the laser microscope system and test measurements using the new system.

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M3 - Conference article

AN - SCOPUS:84890283742

SN - 1824-8039

JO - Proceedings of Science

JF - Proceedings of Science

T2 - 3rd International Workshop on New Photon-Detectors, PhotoDet 2012

Y2 - 13 June 2012 through 15 June 2012

ER -

Study of PPDs with multi-wavelength laser microscope system

Abstract

ASJC Scopus subject areas

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