Structure and transport properties of isomer-separated C82

Yoshihiro Kubozono, Y. Rikiishi, K. Shibata, T. Hosokawa, S. Fujiki, H. Kitagawa

Research output: Contribution to journalArticle

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Abstract

Structure of isomer-separated crystalline C82 has been studied by powder x-ray diffraction with synchrotron radiation. The Rietveld refinement was achieved by assuming a simple cubic lattice (space group Pa3). The C 2(a) symmetry for the C82 molecule was supported in this analysis. Transport properties of thin film of C82 have been studied by resistivity measurement. The thin film showed a narrow-gap semiconductorlike behavior with gap energy of 0.43 eV. The field effect transistor (FET) of a C82 thin film showed an n-channel normally-on depletion-type behavior, and the mobility was 1.9×10-3 cm2 V -1 s-1 whose value was one of the largest μ among normally-on FETs with fullerenes. A hopping transport was found as channel conduction for the C82 FET above 150 K.

Original languageEnglish
Article number165412
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number16
DOIs
Publication statusPublished - Apr 2004

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Field effect transistors
Isomers
Transport properties
field effect transistors
isomers
transport properties
Thin films
thin films
Fullerenes
Rietveld refinement
cubic lattices
Synchrotron radiation
Powders
fullerenes
synchrotron radiation
depletion
Energy gap
x ray diffraction
Diffraction
Crystalline materials

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Structure and transport properties of isomer-separated C82. / Kubozono, Yoshihiro; Rikiishi, Y.; Shibata, K.; Hosokawa, T.; Fujiki, S.; Kitagawa, H.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 69, No. 16, 165412, 04.2004.

Research output: Contribution to journalArticle

Kubozono, Yoshihiro ; Rikiishi, Y. ; Shibata, K. ; Hosokawa, T. ; Fujiki, S. ; Kitagawa, H. / Structure and transport properties of isomer-separated C82. In: Physical Review B - Condensed Matter and Materials Physics. 2004 ; Vol. 69, No. 16.
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