Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS

S. Iida, Y. Kubozono, Y. Slovokhotov, Y. Takabayashi, T. Kanbara, T. Fukunaga, S. Fujiki, S. Emura, S. Kashino

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Abstract

Two isomers of Dy@C82 were separated by high performance liquid chromatography (HPLC), and their UV-VIS absorption spectra were measured to characterize these isomers. The crystalline powder of Dy@C82 was obtained by removing the solvent (toluene) at 250°C under vacuum. The X-ray diffraction pattern can be indexed with fcc crystal lattice, as that in La@C82. The lattice constant a at 298 K, 15.86(1) Å, is close to that of La@C82, 15.78 Å. The distances between Dy and the first and second nearest C atoms are determined to be 2.52(2) and 2.86(2) Å, respectively, on the basis of Dy LIII-edge EXAFS. The XANES shows that the valence of the Dy atom in Dy@C82 is +3.

Original languageEnglish
Pages (from-to)21-28
Number of pages8
JournalChemical Physics Letters
Volume338
Issue number1
DOIs
Publication statusPublished - Apr 13 2001

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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    Iida, S., Kubozono, Y., Slovokhotov, Y., Takabayashi, Y., Kanbara, T., Fukunaga, T., Fujiki, S., Emura, S., & Kashino, S. (2001). Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS. Chemical Physics Letters, 338(1), 21-28. https://doi.org/10.1016/S0009-2614(01)00234-2