Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS

S. Iida, Yoshihiro Kubozono, Y. Slovokhotov, Y. Takabayashi, T. Kanbara, T. Fukunaga, S. Fujiki, S. Emura, S. Kashino

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Abstract

Two isomers of Dy@C82 were separated by high performance liquid chromatography (HPLC), and their UV-VIS absorption spectra were measured to characterize these isomers. The crystalline powder of Dy@C82 was obtained by removing the solvent (toluene) at 250°C under vacuum. The X-ray diffraction pattern can be indexed with fcc crystal lattice, as that in La@C82. The lattice constant a at 298 K, 15.86(1) Å, is close to that of La@C82, 15.78 Å. The distances between Dy and the first and second nearest C atoms are determined to be 2.52(2) and 2.86(2) Å, respectively, on the basis of Dy LIII-edge EXAFS. The XANES shows that the valence of the Dy atom in Dy@C82 is +3.

Original languageEnglish
Pages (from-to)21-28
Number of pages8
JournalChemical Physics Letters
Volume338
Issue number1
DOIs
Publication statusPublished - Apr 13 2001

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Isomers
Electronic properties
X ray powder diffraction
isomers
Atoms
liquid chromatography
Toluene
High performance liquid chromatography
electronics
diffraction
crystal lattices
Crystal lattices
Powders
Diffraction patterns
Lattice constants
atoms
toluene
Absorption spectra
x rays
diffraction patterns

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics

Cite this

Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS. / Iida, S.; Kubozono, Yoshihiro; Slovokhotov, Y.; Takabayashi, Y.; Kanbara, T.; Fukunaga, T.; Fujiki, S.; Emura, S.; Kashino, S.

In: Chemical Physics Letters, Vol. 338, No. 1, 13.04.2001, p. 21-28.

Research output: Contribution to journalArticle

Iida, S, Kubozono, Y, Slovokhotov, Y, Takabayashi, Y, Kanbara, T, Fukunaga, T, Fujiki, S, Emura, S & Kashino, S 2001, 'Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS', Chemical Physics Letters, vol. 338, no. 1, pp. 21-28. https://doi.org/10.1016/S0009-2614(01)00234-2
Iida, S. ; Kubozono, Yoshihiro ; Slovokhotov, Y. ; Takabayashi, Y. ; Kanbara, T. ; Fukunaga, T. ; Fujiki, S. ; Emura, S. ; Kashino, S. / Structure and electronic properties of Dy@ C82 studied by UV-VIS absorption, X-ray powder diffraction and XAFS. In: Chemical Physics Letters. 2001 ; Vol. 338, No. 1. pp. 21-28.
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AU - Iida, S.

AU - Kubozono, Yoshihiro

AU - Slovokhotov, Y.

AU - Takabayashi, Y.

AU - Kanbara, T.

AU - Fukunaga, T.

AU - Fujiki, S.

AU - Emura, S.

AU - Kashino, S.

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