Structural study of the highly conductive tridecylmethylammonium-Au(dmit)2 Langmuir-Blodgett films

Hideaki Matsuzaki, Kazuyoshi Ogasawara, Takehiko Ishiguro, Yoshio Nogami, Motoki Taoda, Hiroki Tachibana, Mutsuyoshi Matsumoto, Takayoshi Nakamura

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The structure of the conductive Langmuir-Blodgett (LB) film consisting of tridecylmethylammonium-Au(dmit)2 (3C10-Au) and arachidic acid is studied by the X-ray diffraction method and atomic force microscopy (AFM). The electrochemically ClO-4-doped film is found to possess four phases with different interlayer spacings by the X-ray diffraction method. The intralayer molecular arrangement is found for the 3C10-Au matrix by AFM.

Original languageEnglish
Pages (from-to)251-255
Number of pages5
JournalSynthetic Metals
Volume74
Issue number3
DOIs
Publication statusPublished - Oct 1995

Keywords

  • Au(dmit)
  • Conductive films
  • Langmuir-Blodgett film
  • Microscopy
  • Tridecylmethylammonium
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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    Matsuzaki, H., Ogasawara, K., Ishiguro, T., Nogami, Y., Taoda, M., Tachibana, H., Matsumoto, M., & Nakamura, T. (1995). Structural study of the highly conductive tridecylmethylammonium-Au(dmit)2 Langmuir-Blodgett films. Synthetic Metals, 74(3), 251-255. https://doi.org/10.1016/0379-6779(95)03376-U