Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect

Masaaki Sugiyama, Takao Mitsui, Takashi Sato, Yoshinori Akai, Yuji Soejima, Hiroshi Orihara, Yang Ho Na, Keiji Itoh, Kazuhiro Mori, Toshiharu Fukunaga

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A distribution of Cu ions in polyelectrolyte film (Nafion) is directly observed with a small-angle X-ray scattering (SAXS) method utilizing an X-ray anomalous dispersion effect. A partial structure factor of the Cu ions, G AA(q), can be derived from the SAXS profiles obtained by scanning the incident X-ray energy around the Cu K absorption edge. GAA(q) has two peaks, indicating that the Cu ions hierarchically distribute in Nafion film. In addition, a standard SAXS also shows that Nafion film has a hierarchical structure. These results mean that the Cu ions locate in the domain where the hydrophilic bases aggregate.

Original languageEnglish
Pages (from-to)8663-8667
Number of pages5
JournalJournal of Physical Chemistry B
Volume111
Issue number29
DOIs
Publication statusPublished - Jul 26 2007

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect'. Together they form a unique fingerprint.

Cite this