Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect

Masaaki Sugiyama; Takao Mitsui; Takashi Sato; Yoshinori Akai; Yuji Soejima; Hiroshi Orihara; Yang Ho Na; Keiji Itoh; Kazuhiro Mori; Toshiharu Fukunaga

doi:10.1021/jp0716076

Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect

Masaaki Sugiyama, Takao Mitsui, Takashi Sato, Yoshinori Akai, Yuji Soejima, Hiroshi Orihara, Yang Ho Na, Keiji Itoh, Kazuhiro Mori, Toshiharu Fukunaga

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

A distribution of Cu ions in polyelectrolyte film (Nafion) is directly observed with a small-angle X-ray scattering (SAXS) method utilizing an X-ray anomalous dispersion effect. A partial structure factor of the Cu ions, G _AA(q), can be derived from the SAXS profiles obtained by scanning the incident X-ray energy around the Cu K absorption edge. G_AA(q) has two peaks, indicating that the Cu ions hierarchically distribute in Nafion film. In addition, a standard SAXS also shows that Nafion film has a hierarchical structure. These results mean that the Cu ions locate in the domain where the hydrophilic bases aggregate.

Original language	English
Pages (from-to)	8663-8667
Number of pages	5
Journal	Journal of Physical Chemistry B
Volume	111
Issue number	29
DOIs	https://doi.org/10.1021/jp0716076
Publication status	Published - Jul 26 2007
Externally published	Yes

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Surfaces, Coatings and Films
Materials Chemistry

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10.1021/jp0716076

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Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect. / Sugiyama, Masaaki; Mitsui, Takao; Sato, Takashi; Akai, Yoshinori; Soejima, Yuji; Orihara, Hiroshi; Na, Yang Ho; Itoh, Keiji; Mori, Kazuhiro; Fukunaga, Toshiharu.

In: Journal of Physical Chemistry B, Vol. 111, No. 29, 26.07.2007, p. 8663-8667.

Research output: Contribution to journal › Article › peer-review

Sugiyama, Masaaki ; Mitsui, Takao ; Sato, Takashi ; Akai, Yoshinori ; Soejima, Yuji ; Orihara, Hiroshi ; Na, Yang Ho ; Itoh, Keiji ; Mori, Kazuhiro ; Fukunaga, Toshiharu. / Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect. In: Journal of Physical Chemistry B. 2007 ; Vol. 111, No. 29. pp. 8663-8667.

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abstract = "A distribution of Cu ions in polyelectrolyte film (Nafion) is directly observed with a small-angle X-ray scattering (SAXS) method utilizing an X-ray anomalous dispersion effect. A partial structure factor of the Cu ions, G AA(q), can be derived from the SAXS profiles obtained by scanning the incident X-ray energy around the Cu K absorption edge. GAA(q) has two peaks, indicating that the Cu ions hierarchically distribute in Nafion film. In addition, a standard SAXS also shows that Nafion film has a hierarchical structure. These results mean that the Cu ions locate in the domain where the hydrophilic bases aggregate.",

author = "Masaaki Sugiyama and Takao Mitsui and Takashi Sato and Yoshinori Akai and Yuji Soejima and Hiroshi Orihara and Na, {Yang Ho} and Keiji Itoh and Kazuhiro Mori and Toshiharu Fukunaga",

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AU - Sugiyama, Masaaki

AU - Mitsui, Takao

AU - Sato, Takashi

AU - Akai, Yoshinori

AU - Soejima, Yuji

AU - Orihara, Hiroshi

AU - Na, Yang Ho

AU - Itoh, Keiji

AU - Mori, Kazuhiro

AU - Fukunaga, Toshiharu

PY - 2007/7/26

Y1 - 2007/7/26

N2 - A distribution of Cu ions in polyelectrolyte film (Nafion) is directly observed with a small-angle X-ray scattering (SAXS) method utilizing an X-ray anomalous dispersion effect. A partial structure factor of the Cu ions, G AA(q), can be derived from the SAXS profiles obtained by scanning the incident X-ray energy around the Cu K absorption edge. GAA(q) has two peaks, indicating that the Cu ions hierarchically distribute in Nafion film. In addition, a standard SAXS also shows that Nafion film has a hierarchical structure. These results mean that the Cu ions locate in the domain where the hydrophilic bases aggregate.

AB - A distribution of Cu ions in polyelectrolyte film (Nafion) is directly observed with a small-angle X-ray scattering (SAXS) method utilizing an X-ray anomalous dispersion effect. A partial structure factor of the Cu ions, G AA(q), can be derived from the SAXS profiles obtained by scanning the incident X-ray energy around the Cu K absorption edge. GAA(q) has two peaks, indicating that the Cu ions hierarchically distribute in Nafion film. In addition, a standard SAXS also shows that Nafion film has a hierarchical structure. These results mean that the Cu ions locate in the domain where the hydrophilic bases aggregate.

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Structural analysis of polyelectrolyte film absorbing metal ion by SAXS utilizing with X-ray anomalous dispersion effect

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