Straightforward Measurement Method of Common Source Inductance for Fast Switching Semiconductor Devices Mounted on Board

Research output: Contribution to journalArticle

10 Citations (Scopus)


Recent progress of widebandgap semiconductor switching devices enabled extremely high-frequency operation of power converters owing to their ultrafast switching capability. Fast switching may cause large switching noise at the common source inductance, which may increase the switching loss and lead to false triggering. Therefore, measurement of the common source inductance is often intensely required in practical design of fast switching power converters. However, measurement of the common source inductance is difficult, because 1) the wiring path hidden beneath the molded package significantly contributes to this inductance, 2) the mutual inductance between the gating circuit and the power circuit also contributes to this inductance, and 3) this inductance cannot be defined as the stray inductance of a loop wiring path. These difficulties are addressed in this paper by proposing a novel measurement method of the common source inductance. The proposed method is applicable to already-mounted power circuits. In addition, the proposed method offers a straightforward measurement procedure with common instruments, such as a signal generator, an oscilloscope, and voltage and current probes. Along with the measurement principle, this paper also presents an experiment to evaluate the proposed method.

Original languageEnglish
Article number7902146
Pages (from-to)8258-8267
Number of pages10
JournalIEEE Transactions on Industrial Electronics
Issue number10
Publication statusPublished - Oct 1 2017



  • Common source inductance
  • Inductance measurement
  • Semiconductor package
  • Stray inductance

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

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