Soft x-ray spectra of highly ionized elements with atomic numbers ranging from 57 to 82 produced by compact lasers

G. M. Zeng, H. Daido, Takeshi Nishikawa, H. Takabe, S. Nakayama, H. Aritome, K. Murai, Y. Kato, M. Nakatsuka, S. Nakai

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

X-ray emission spectra in the spectral range of 2-13 nm from 19 kinds of material with high atomic numbers (lanthanum through lead) were recorded with a grazing incidence spectrometer equipped with a microchannel plate detector. There is an intense, narrow spectral band in these spectra which shifts toward shorter wavelength and becomes weak in intensity with increasing atomic number. The materials were irradiated either by a 4 J/35 ns slab Nd:glass laser or by a 0.5 J/8 ns Nd:YAG laser. The absolute photon intensities of the spectra were determined with an absolutely calibrated charge coupled device camera. The peak spectral brightness of the emission at the peak intensity of the spectral band for lanthanum plasma was estimated to be 2.1×1016 photons/s/mm2/mrad2 in 0.1% bandwidth. The origin of the narrow, intense spectral bands in the recorded spectra and their dependence on target materials and laser wavelength are interpreted.

Original languageEnglish
Pages (from-to)1923-1930
Number of pages8
JournalJournal of Applied Physics
Volume75
Issue number4
DOIs
Publication statusPublished - 1994
Externally publishedYes

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x ray spectra
spectral bands
lanthanum
lasers
microchannel plates
glass lasers
photons
grazing incidence
wavelengths
YAG lasers
charge coupled devices
brightness
slabs
emission spectra
cameras
spectrometers
bandwidth
shift
detectors
x rays

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Soft x-ray spectra of highly ionized elements with atomic numbers ranging from 57 to 82 produced by compact lasers. / Zeng, G. M.; Daido, H.; Nishikawa, Takeshi; Takabe, H.; Nakayama, S.; Aritome, H.; Murai, K.; Kato, Y.; Nakatsuka, M.; Nakai, S.

In: Journal of Applied Physics, Vol. 75, No. 4, 1994, p. 1923-1930.

Research output: Contribution to journalArticle

Zeng, GM, Daido, H, Nishikawa, T, Takabe, H, Nakayama, S, Aritome, H, Murai, K, Kato, Y, Nakatsuka, M & Nakai, S 1994, 'Soft x-ray spectra of highly ionized elements with atomic numbers ranging from 57 to 82 produced by compact lasers', Journal of Applied Physics, vol. 75, no. 4, pp. 1923-1930. https://doi.org/10.1063/1.356339
Zeng, G. M. ; Daido, H. ; Nishikawa, Takeshi ; Takabe, H. ; Nakayama, S. ; Aritome, H. ; Murai, K. ; Kato, Y. ; Nakatsuka, M. ; Nakai, S. / Soft x-ray spectra of highly ionized elements with atomic numbers ranging from 57 to 82 produced by compact lasers. In: Journal of Applied Physics. 1994 ; Vol. 75, No. 4. pp. 1923-1930.
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AU - Zeng, G. M.

AU - Daido, H.

AU - Nishikawa, Takeshi

AU - Takabe, H.

AU - Nakayama, S.

AU - Aritome, H.

AU - Murai, K.

AU - Kato, Y.

AU - Nakatsuka, M.

AU - Nakai, S.

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N2 - X-ray emission spectra in the spectral range of 2-13 nm from 19 kinds of material with high atomic numbers (lanthanum through lead) were recorded with a grazing incidence spectrometer equipped with a microchannel plate detector. There is an intense, narrow spectral band in these spectra which shifts toward shorter wavelength and becomes weak in intensity with increasing atomic number. The materials were irradiated either by a 4 J/35 ns slab Nd:glass laser or by a 0.5 J/8 ns Nd:YAG laser. The absolute photon intensities of the spectra were determined with an absolutely calibrated charge coupled device camera. The peak spectral brightness of the emission at the peak intensity of the spectral band for lanthanum plasma was estimated to be 2.1×1016 photons/s/mm2/mrad2 in 0.1% bandwidth. The origin of the narrow, intense spectral bands in the recorded spectra and their dependence on target materials and laser wavelength are interpreted.

AB - X-ray emission spectra in the spectral range of 2-13 nm from 19 kinds of material with high atomic numbers (lanthanum through lead) were recorded with a grazing incidence spectrometer equipped with a microchannel plate detector. There is an intense, narrow spectral band in these spectra which shifts toward shorter wavelength and becomes weak in intensity with increasing atomic number. The materials were irradiated either by a 4 J/35 ns slab Nd:glass laser or by a 0.5 J/8 ns Nd:YAG laser. The absolute photon intensities of the spectra were determined with an absolutely calibrated charge coupled device camera. The peak spectral brightness of the emission at the peak intensity of the spectral band for lanthanum plasma was estimated to be 2.1×1016 photons/s/mm2/mrad2 in 0.1% bandwidth. The origin of the narrow, intense spectral bands in the recorded spectra and their dependence on target materials and laser wavelength are interpreted.

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