Soft x-ray photoemission study of new BiS2-layered superconductor LaO1-xFxBiS2

Shinsuke Nagira, Junki Sonoyama, Takanori Wakita, Masanori Sunagawa, Yudai Izumi, Takayuki Muro, Hiroshi Kumigashira, Masaharu Oshima, Keita Deguchi, Hiroyuki Okazaki, Yoshihiko Takano, Osuke Miura, Yoshikazu Mizuguchi, Katsuhiro Suzuki, Hidetomo Usui, Kazuhiko Kuroki, Kozo Okada, Yuji Muraoka, Takayoshi Yokoya

Research output: Contribution to journalArticle

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Abstract

We use core level and valence band soft X-ray photoemission spectroscopy (SXPES) to investigate the electronic structure of new BiS2 layered superconductor LaO1-xFxBiS2. The core level spectra of doped samples show a new spectral feature on the lower binding energy side of the Bi 4f main peak, which may be explained by core-hole screening with metallic states near the Fermi level (EF). The experimental electronic structure and its x dependence (a higher binding energy shift of the valence band as well as appearance of new states near EF having the dominant Bi 6p character) were found to be consistent with the predictions of band structure calculations in general. Noticeable deviation of the spectral shape of the states near EF from that of calculations might provide insight into interesting physical properties. This study provides the first experimental electronic structure of the new BiS2 layered superconductors.

Original languageEnglish
Article number033703
JournalJournal of the Physical Society of Japan
Volume83
Issue number3
DOIs
Publication statusPublished - Mar 15 2014

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photoelectric emission
electronic structure
binding energy
valence
x rays
screening
physical properties
deviation
shift
predictions
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Soft x-ray photoemission study of new BiS2-layered superconductor LaO1-xFxBiS2. / Nagira, Shinsuke; Sonoyama, Junki; Wakita, Takanori; Sunagawa, Masanori; Izumi, Yudai; Muro, Takayuki; Kumigashira, Hiroshi; Oshima, Masaharu; Deguchi, Keita; Okazaki, Hiroyuki; Takano, Yoshihiko; Miura, Osuke; Mizuguchi, Yoshikazu; Suzuki, Katsuhiro; Usui, Hidetomo; Kuroki, Kazuhiko; Okada, Kozo; Muraoka, Yuji; Yokoya, Takayoshi.

In: Journal of the Physical Society of Japan, Vol. 83, No. 3, 033703, 15.03.2014.

Research output: Contribution to journalArticle

Nagira, S, Sonoyama, J, Wakita, T, Sunagawa, M, Izumi, Y, Muro, T, Kumigashira, H, Oshima, M, Deguchi, K, Okazaki, H, Takano, Y, Miura, O, Mizuguchi, Y, Suzuki, K, Usui, H, Kuroki, K, Okada, K, Muraoka, Y & Yokoya, T 2014, 'Soft x-ray photoemission study of new BiS2-layered superconductor LaO1-xFxBiS2', Journal of the Physical Society of Japan, vol. 83, no. 3, 033703. https://doi.org/10.7566/JPSJ.83.033703
Nagira, Shinsuke ; Sonoyama, Junki ; Wakita, Takanori ; Sunagawa, Masanori ; Izumi, Yudai ; Muro, Takayuki ; Kumigashira, Hiroshi ; Oshima, Masaharu ; Deguchi, Keita ; Okazaki, Hiroyuki ; Takano, Yoshihiko ; Miura, Osuke ; Mizuguchi, Yoshikazu ; Suzuki, Katsuhiro ; Usui, Hidetomo ; Kuroki, Kazuhiko ; Okada, Kozo ; Muraoka, Yuji ; Yokoya, Takayoshi. / Soft x-ray photoemission study of new BiS2-layered superconductor LaO1-xFxBiS2. In: Journal of the Physical Society of Japan. 2014 ; Vol. 83, No. 3.
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