TY - GEN
T1 - Soft-error tolerance of an optically reconfigurable gate array VLSI
AU - Fujimori, Takumi
AU - Watanabe, Minoru
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2019/2/8
Y1 - 2019/2/8
N2 - The damaged reactors and melted nuclear fuel of the Fukushima Daiichi nuclear power plant present an extremely intense radiation environment. Decommissioning project members are estimating that the maximum radiation intensity around the melted reactors and melted nuclear fuel is 1000 Sv/h. Since humans cannot approach the region, robots must take the lead in decommissioning operations. Such robots need semiconductor devices for operations. However, such devices are exceptionally vulnerable to radiation. Therefore, a radiation-hardened optically reconfigurable gate array (ORGA) has under development Although the ORGA is also constructed using the same radiation-vulnerable semiconductor technology as that used in currently available radiation-hardened devices, ORGAs use a holographic memory technology to increase the radiation tolerance of semiconductor device components. The soft-error tolerance has been confirmed using an americium alpha particle radiation source (Am-241) as 181 times higher than Artix-7 FPGAs using a high-speed optical scrubbing operation.
AB - The damaged reactors and melted nuclear fuel of the Fukushima Daiichi nuclear power plant present an extremely intense radiation environment. Decommissioning project members are estimating that the maximum radiation intensity around the melted reactors and melted nuclear fuel is 1000 Sv/h. Since humans cannot approach the region, robots must take the lead in decommissioning operations. Such robots need semiconductor devices for operations. However, such devices are exceptionally vulnerable to radiation. Therefore, a radiation-hardened optically reconfigurable gate array (ORGA) has under development Although the ORGA is also constructed using the same radiation-vulnerable semiconductor technology as that used in currently available radiation-hardened devices, ORGAs use a holographic memory technology to increase the radiation tolerance of semiconductor device components. The soft-error tolerance has been confirmed using an americium alpha particle radiation source (Am-241) as 181 times higher than Artix-7 FPGAs using a high-speed optical scrubbing operation.
KW - Field programmable gate arrays
KW - Optically reconfigurable gate arrays
KW - Soft-error tolerance
KW - Space embedded systems
UR - http://www.scopus.com/inward/record.url?scp=85063138035&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85063138035&partnerID=8YFLogxK
U2 - 10.1109/ICSENG.2018.8638203
DO - 10.1109/ICSENG.2018.8638203
M3 - Conference contribution
AN - SCOPUS:85063138035
T3 - 26th International Conference on Systems Engineering, ICSEng 2018 - Proceedings
BT - 26th International Conference on Systems Engineering, ICSEng 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 26th International Conference on Systems Engineering, ICSEng 2018
Y2 - 18 December 2018 through 20 December 2018
ER -