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SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials
Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki
Research output: Contribution to journal › Article › peer-review
25
Citations
(Scopus)