TY - JOUR
T1 - Significant suppression of island growth in epitaxial (Pb,La)(Zr,Ti)O3 thin films by two-step growth technique
AU - Kondo, Shinya
AU - Yamada, Tomoaki
AU - Yoshino, Masahito
AU - Shiota, Tadashi
AU - Shinozaki, Kazuo
AU - Nagasaki, Takanori
N1 - Funding Information:
This work was partly supported by Concert- Japan Project "FF-Photon" from Japan Science and Technology Agency. We thank Dr. Ping Ma at ETH-Zurich for fruitful discussions.
Publisher Copyright:
©2016 The Ceramic Society of Japan. All rights reserved.
PY - 2016/10
Y1 - 2016/10
N2 - (001)-epitaxial (Pb0.91La0.09)(Zr0.65Ti0.35)O3 (PLZT) ferroelectric thin films were fabricated on SrTiO3 and MgO substrates, with an SrRuO3 bottom electrode layer, using pulsed laser deposition. When films were deposited in a single step at a high temperature conventionally used for epitaxial growth, island growth was observed. To suppress the island growth, we used a two-step growth technique. First, a thin initial layer was deposited at a low temperature to promote rapid strain relaxation from the lattice mismatch. Consequently, the island growth was suppressed and when a second layer was deposited at high temperature, a remarkably flatter surface was achieved as compared with that of conventional one-step-grown films. The two-step-grown PLZT films are promising for use in ferroelectric thin film-based plasmonic electro-optic devices.
AB - (001)-epitaxial (Pb0.91La0.09)(Zr0.65Ti0.35)O3 (PLZT) ferroelectric thin films were fabricated on SrTiO3 and MgO substrates, with an SrRuO3 bottom electrode layer, using pulsed laser deposition. When films were deposited in a single step at a high temperature conventionally used for epitaxial growth, island growth was observed. To suppress the island growth, we used a two-step growth technique. First, a thin initial layer was deposited at a low temperature to promote rapid strain relaxation from the lattice mismatch. Consequently, the island growth was suppressed and when a second layer was deposited at high temperature, a remarkably flatter surface was achieved as compared with that of conventional one-step-grown films. The two-step-grown PLZT films are promising for use in ferroelectric thin film-based plasmonic electro-optic devices.
KW - Electro-optic device
KW - Epitaxial growth
KW - Ferroelectric
KW - Growth mode
KW - PLZT
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U2 - 10.2109/jcersj2.16110
DO - 10.2109/jcersj2.16110
M3 - Article
AN - SCOPUS:84991709207
SN - 1882-0743
VL - 124
SP - 1127
EP - 1131
JO - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
JF - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
IS - 10
ER -