Shape measurement of BGA for analysis of defects by X-ray imaging

T. Sumimoto, Toshinori Maruyama, Y. Azuma, Sachiko Goto, M. Mondou, N. Furukawa, S. Okada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper deals with the developmment of image analysis for the detection of defects at BGA solder joints in PC boards by using X-ray imaging. We can't detect visually defects at BGA solder joints, because they are hidden under the IC package. To improve a cost performance and the reliability of PC boards, an inspection of BGA is required in the surface mount process. Types of defects at BGA solder joints are solder bridge, missing connection, solder voids, open connection and miss-registration of parts. As we can find mostly solder bridge in these defects, we pick up this to detect solder bridge in a production line. The problems of image analysis for the detection of defects at BGA solder joints are the detection accuracy and image processing time according to a line speed of production. To get design data for the development of the inspection system, which can be used easily in the surface mount process, it is important to develop image analysis techniques based on X-ray image data. At the first step of our study, we attempt to measure the shape of BGA based on X-ray imaging.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsZ. Guangjun, Z. Huijie, W. Zhongyu
Pages361-365
Number of pages5
Volume5253
DOIs
Publication statusPublished - 2003
EventFifth International Symposium on Instrumentation and Control Technology - Beijing, China
Duration: Oct 24 2003Oct 27 2003

Other

OtherFifth International Symposium on Instrumentation and Control Technology
CountryChina
CityBeijing
Period10/24/0310/27/03

    Fingerprint

Keywords

  • Ball Grid Array(BGA)
  • Image analysis
  • PC boards
  • Shape measurement
  • X-ray

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sumimoto, T., Maruyama, T., Azuma, Y., Goto, S., Mondou, M., Furukawa, N., & Okada, S. (2003). Shape measurement of BGA for analysis of defects by X-ray imaging. In Z. Guangjun, Z. Huijie, & W. Zhongyu (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5253, pp. 361-365) https://doi.org/10.1117/12.521903